Translations:The Eyewire Lexicon/110/en
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SBEM: Serial Block Electron Microscopy or Serial Block Face Electron Microscopy (SBFSEM) was specifically developed for imaging neurons. After the sample is stained with a heavy metal, it is inserted into the SEM. The surface of the sample is imaged and then it is shaved off, exposing a layer of the surface underneath the layer that was just imaged. While this is a very effective process, it is also destructive to the sample; if a mistake is made, there is no second chance. Misalignments are the expression of such faults.