Latest revision as of 18:23, 14 June 2016
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Message definition (Serial block-face scanning electron microscopy (SBFSEM) )
Before any imaging could be done, the sample was stained with heavy metals. When the scanning electron microscope's electrons collided with the heavy metals in the sample, they would bounce off and they would be collected by a detector. These electrons that bounce off the sample are known as backscattered electrons. After being placed inside the chamber of the microscope, the surface of the sample is imaged. Because the Scanning Electron Microscope uses a tightly focused beam of electrons, the sample needs to be scanned in a certain pattern. The Scanning Electron Microscope will move across a line, scanning it one piece at a time, and then it will move onto the next line. This is known as raster-scanning.
Before any imaging could be done, the sample was stained with heavy metals. When the scanning electron microscope's electrons collided with the heavy metals in the sample, they would bounce off and they would be collected by a detector. These electrons that bounce off the sample are known as backscattered electrons. After being placed inside the chamber of the microscope, the surface of the sample is imaged. Because the Scanning Electron Microscope uses a tightly focused beam of electrons, the sample needs to be scanned in a certain pattern. The Scanning Electron Microscope will move across a line, scanning it one piece at a time, and then it will move onto the next line. This is known as raster-scanning. Translation Before any imaging could be done, the sample was stained with heavy metals. When the scanning electron microscope's electrons collided with the heavy metals in the sample, they would bounce off and they would be collected by a detector. These electrons that bounce off the sample are known as backscattered electrons. After being placed inside the chamber of the microscope, the surface of the sample is imaged. Because the Scanning Electron Microscope uses a tightly focused beam of electrons, the sample needs to be scanned in a certain pattern. The Scanning Electron Microscope will move across a line, scanning it one piece at a time, and then it will move onto the next line. This is known as raster-scanning. Before any imaging could be done, the sample was stained with heavy metals. When the scanning electron microscope's electrons collided with the heavy metals in the sample, they would bounce off and they would be collected by a detector. These electrons that bounce off the sample are known as backscattered electrons. After being placed inside the chamber of the microscope, the surface of the sample is imaged. Because the Scanning Electron Microscope uses a tightly focused beam of electrons, the sample needs to be scanned in a certain pattern. The Scanning Electron Microscope will move across a line, scanning it one piece at a time, and then it will move onto the next line. This is known as raster-scanning.
